Hikrayin Intelligent X-Ray Defect Detection System (ISD-NFB4016B-A3)

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The Hikrayin ISD-NFB4016B-A3 Intelligent X-Ray Defect Detection System delivers advanced inspection performance with high-definition X-ray imaging, AI-powered defect recognition, and enhanced image processing for precise internal analysis. Flexible inspection workflows and integration options support both standalone and production-line use, while automated analysis improves consistency and reduces manual review. Suitable for a wide range of industrial applications, the system also provides full traceability, reporting, and quality assurance to support rigorous manufacturing standards.

Advanced Performance Hikrayin ISD-NFB4016B-A3 Intelligent X-Ray Defect Detection System
The Hikrayin ISD-NFB4016B-A3 Intelligent X-Ray Defect Detection System is a high-precision industrial inspection solution engineered for non-destructive testing, quality control, and reliable internal defect detection across demanding manufacturing environments, enabling the identification of hidden flaws, foreign inclusions, and structural irregularities within components, assemblies, and finished products.

High-Definition X-Ray Imaging Clarity
Equipped with a high-performance X-ray imaging engine, the system produces detailed internal images capable of revealing fine defects, misalignments, foreign particles, and structural inconsistencies. Advanced image processing enhances contrast, reduces noise, and delivers exceptionally clear internal visuals for accurate assessment.

AI-Powered Automatic Defect Recognition
Intelligent detection algorithms automatically analyze X-ray images to identify voids, foreign objects, missing parts, misalignment, and abnormal internal structures. This automated evaluation reduces reliance on manual inspection while improving inspection consistency across high production volumes.

Comprehensive Image Review & Operator Control
Operators benefit from a full suite of image review tools including zoom and magnification, contrast and brightness adjustment, density filtering, positive and negative inversion, and multi-angle or slice-by-slice inspection where supported. These features enable precise and confident examination of internal structures.

Flexible Inspection Workflows
Designed for both offline batch inspection and inline or near-line integration within production workflows, the system adapts easily from prototyping environments to high-volume manufacturing lines. User-friendly software supports image annotation, defect review, reporting, and export of inspection data for traceability and audit purposes.

Repeatable, Standardized Inspection
Inspection parameters and detection templates can be saved and reused, ensuring every scan follows a consistent, repeatable process. This eliminates operator variation and reinforces robust quality control standards.

Wide Industrial Application Scope
Suitable for electronics manufacturing including PCBs, SMT assemblies, BGAs, and semiconductors, as well as battery production, metal and mechanical part fabrication, and quality control laboratories requiring dependable internal defect detection.

Traceability, Reporting and Quality Assurance
All inspection data, including raw X-ray images, enhanced views, analysis results, and defect logs, can be archived and exported to support full traceability, documentation, and compliance with quality management processes. Early defect detection reduces waste, minimizes recall risk, and improves overall manufacturing reliability and cost efficiency.

Specifications

Model / Part NumberISD-NFB4016B-A3
System Dimensions2042 mm (L) x 1308 mm (W) x 1056 mm (H)
Tunnel Size400 mm (H) × 160 mm (W)
Conveyor width440 mm
Conveyor Height800 mm adjustable
Conveyor Speed10 ~ 60 m/min
Maximum Capacity10 kg
Anode Voltage & Cooling40 ~ 80 kV
Tube Current4000 ~ 8000 μA
Generator Power Consumption350W max
Detector0.1 mm
Power Supply230 VAC (±10%)  50±3Hz
Operating Temperature/Humidity-10°C ~ 40°C / 5% ~ 97% (non-condensing)
IP ProtectionIP66
Radiation Protection4 Layers of Lead for both Entrance and Exit
Radiation Leakage< 1μSv/h
PortsNetwork, USB, MES Connection

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